VLSI Test Principles and Architectures: Design for Testability

Name: VLSI Test Principles and Architectures: Design for Testability
Brand: Morgan Kaufmann
SKU: b4b089c73c2be2cc461e5c72fef241b2

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VLSI Test Principles and Architectures: Design for Testability

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VLSI Test Principles and Architectures: Design for Testability

Marca	Morgan Kaufmann
EAN	9781493300860

Independently Published

Design for Testability in VLSI: Scan Design, ATPG, Built-In Self-Test, Fault Modeling,...

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