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Design for Testability in VLSI: Scan Design, ATPG, Built-In Self-Test, Fault Modeling, Test Compression, and Optimization (VLSI & Semiconductor Engineering)

Name: Design for Testability in VLSI: Scan Design, ATPG, Built-In Self-Test, Fault Modeling, Test Compression, and Optimization (VLSI & Semiconductor Engineering)
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Design for Testability in VLSI: Scan Design, ATPG, Built-In Self-Test, Fault Modeling, Test Compression, and Optimization (VLSI & Semiconductor Engineering)